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Perturbation model for computing optical fiber birefringence from a two-dimensional refractive-index profile

โœ Scribed by Chowdhury, Dipakbin Q.; Nolan, Daniel A.


Book ID
115421408
Publisher
Optical Society of America
Year
1995
Tongue
English
Weight
262 KB
Volume
20
Category
Article
ISSN
0146-9592

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We report a new configuration of a reflection-type confocal scanning optical microscope system for measuring the refractive index profile of an optical waveguide. Several improvements on the earlier design are proposed; a light emitting diode at 650 nm wavelength instead of a laser diode or He-Ne la