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Peripheral imperfections and their effects on efficiency in Si(Li) X-ray detectors

โœ Scribed by J.L. Campbell; R.G. Leigh; W.J. Teesdale


Book ID
113276703
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
514 KB
Volume
5
Category
Article
ISSN
0168-583X

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