✦ LIBER ✦
Perimeter governed minority carrier lifetimes in 4H-SiC p+n diodes measured by reverse recovery switching transient analysis
✍ Scribed by Philip G. Neudeck
- Book ID
- 107457816
- Publisher
- Springer US
- Year
- 1998
- Tongue
- English
- Weight
- 185 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0361-5235
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