Performance of the focused-ion-striped transistor (FIST)—A new MESFET structure produced by focused-ion-beam implantation

✍ Scribed by Rensch, D.B.; Matthews, D.S.; Utlaut, M.W.; Courtney, M.D.; Clark, W.M., Jr.

• Book ID: 114596111
• Publisher: IEEE
• Year: 1987
• Tongue: English
• Weight: 705 KB
• Volume: 34
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1987.23225