Performance evaluation of the LP test algorithm for finding all solutions of piecewise-linear resistive circuits

✍ Scribed by Kiyotaka Yamamura; Shigeru Tanaka

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 62 KB
• Volume: 28
• Category: Article
• ISSN: 0098-9886
• DOI: 10.1002/1097-007x(200009/10)28:5<501::aid-cta116>3.0.co;2-f