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Performance enhancement in p-channel charge-trapping flash memory devices with Si/Ge super-lattice channel and band-to-band tunneling induced hot-electron injection

โœ Scribed by Liu, Li-Jung; Chang-Liao, Kuei-Shu; Jian, Yi-Chuen; Wang, Tien-Ko; Tsai, Ming-Jinn


Book ID
123269255
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
731 KB
Volume
533
Category
Article
ISSN
0040-6090

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Enhanced operation and retention charact
โœ Li-Jung Liu; Kuei-Shu Chang-Liao; Yi-Chuen Jian; Tien-Ko Wang ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 976 KB

Charge-trapping flash memory devices with super-lattice channels having different stacking structures and thicknesses of Ge top-layer are investigated in this work. Both programming and erasing speeds are significantly improved for devices with super-lattice channels. Programming speed increases wit