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Performance Enhancement in Multi Gate Tunneling Field Effect Transistors by Scaling the Fin-Width

✍ Scribed by Leonelli, Daniele; Vandooren, Anne; Rooyackers, Rita; Verhulst, Anne S.; Gendt, Stefan De; Heyns, Marc M.; Groeseneken, Guido


Book ID
120496878
Publisher
Institute of Pure and Applied Physics
Year
2010
Tongue
English
Weight
580 KB
Volume
49
Category
Article
ISSN
0021-4922

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