✦ LIBER ✦
Performance degradation of GaN field-effect transistors due to thermal boundary resistance at GaN∕substrate interface
✍ Scribed by Turin, V.O.; Balandin, A.A.
- Book ID
- 120059310
- Publisher
- The Institution of Electrical Engineers
- Year
- 2004
- Tongue
- English
- Weight
- 205 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0013-5194
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