Pd-induced effects in the electronic structure of thin Cu and Au films

✍ Scribed by Aleksandra A. Wronkowska; Andrzej Wronkowski; Hans Arwin

• Book ID: 104266285
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 135 KB
• Volume: 54
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/s0042-207x(98)00454-0

✦ Synopsis

Spectroscopic ellipsometry was employed to determine the complex dielectric functions of thin polycrystalline Cu films affected by diffusion of the Pd atoms from substrate through the film. The features observed in the optical absorption were analysed assuming additive contributions related to the Friedel-Anderson theory of virtual-bound-state (VBS) alloys and an effective medium microstructure. This procedure made it possible to estimate concentration of Pd in diffusive layers and to find the VBS parameters. Such a virtual level-shape parameters as half-width ( "0.28 eV) and the distance in energy of the centre of VBS from the Fermi level of Cu (E "1.