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PD-0032 A FAST AND ACCURATE METHOD FOR FIELD CHARACTERIZATION IN LOW AND MEDIUM ENERGY X-RAY BEAMS

✍ Scribed by D. Rodríguez Latorre; A. Latorre-Musoll; T. Eudaldo Puell; P. Carrasco de Fez; N. Jornet i Sala; A. Ruiz Martínez; T. Martínez Jurado; D. Macià Bros; M. Ribas Morales

Book ID: 119520210
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 647 KB
Volume: 103
Category: Article
ISSN: 0167-8140
DOI: 10.1016/s0167-8140(12)70371-7

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