✦ LIBER ✦
Pb-Sn alloy microstructure: potential reliability indicator for interconnects : G. D. O'Clock Jr, M. S. Peters, J. R. Pater, G. A. Kleese and R. V. Martini. IEEE Trans. Compon. Hybrids mfg Technol.CHMT-10, 82 (1987)
- Book ID
- 103282254
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 225 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.