Pauli tomography: complete characterization of a single qubit device

✍ Scribed by A. Mazzei; M. Ricci; F. De Martini; G.M. D'Ariano

• Book ID: 105357278
• Publisher: John Wiley and Sons
• Year: 2003
• Tongue: English
• Weight: 237 KB
• Volume: 51
• Category: Article
• ISSN: 0015-8208
• DOI: 10.1002/prop.200310047

✦ Synopsis

Abstract

We present the first full experimental characterization of a single‐qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n‐qubits processing device.