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Patterning of high Tc films for critical current measurements

✍ Scribed by W.K. Schomburg; M. Heidinger; G. Nöther; J. Reiner; V. Windte; W. Schauer; K. Kadel

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
367 KB
Volume
31
Category
Article
ISSN
0011-2275

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✦ Synopsis

A patterning process for YBCO films is described which does not change the critical properties of the superconducting films. Improvements achieved in the preparation and measuring technique described make it possible to perform reliable and reproducible measurements of critical current density of high To and high Jc film samples.

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