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Pattern recognition methods for thermal drift correction in Atomic Force Microscopy imaging

✍ Scribed by M. D’Acunto; O. Salvetti

Book ID: 110209720
Publisher: SP MAIK Nauka/Interperiodica
Year: 2011
Tongue: English
Weight: 843 KB
Volume: 21
Category: Article
ISSN: 1054-6618
DOI: 10.1134/s1054661811010056

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