Pattern generation for delay testing and dynamic timing analysis considering power-supply noise effects

✍ Scribed by Krstic, A.; Yi-Min Jiang; Kwang-Ting Cheng

• Book ID: 119778756
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 158 KB
• Volume: 20
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.913759