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Pathways for microstructural development in TiAl

✍ Scribed by J.A. Graves; L.A. Bendersky; F.S. Biancaniello; J.H. Perepezko; W.J. Boettinger

Book ID
103265878
Publisher
Elsevier Science
Year
1988
Weight
495 KB
Volume
98
Category
Article
ISSN
0025-5416

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## Abstract The microstructure and development of the scale of oxidized γ‐TiAl were studied in cross section by electron microscopy and metallographic techniques. Ti‐50(at.%)Al samples were oxidized at 900Β°C in air for various times and especially the evolution of the scale/metal interface was inve