Path Delay Test Generation Toward Activation of Worst Case Coupling Effects

✍ Scribed by Minjin Zhang; Huawei Li; Xiaowei Li

• Book ID: 118275688
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 567 KB
• Volume: 19
• Category: Article
• ISSN: 1063-8210
• DOI: 10.1109/tvlsi.2010.2075945