Patent Citation, R&D Spillover, and Tobin's Q: Evidence from Taiwan Semiconductor Industry

✍ Scribed by Chen-Lung Chin; Picheng Lee; Hsin-Yi Chi; Asokan Anandarajan

• Publisher: Springer US
• Year: 2006
• Tongue: English
• Weight: 260 KB
• Volume: 26
• Category: Article
• ISSN: 0924-865X
• DOI: 10.1007/s11156-006-7034-1