✦ LIBER ✦
Passivation cracking analysis of integrated-circuit microstructures under aeronautical conditions
✍ Scribed by Yuting He; Hongpeng Li; Hengxi Zhang; Feng Li; Chaohua Fan
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 563 KB
- Volume
- 483-484
- Category
- Article
- ISSN
- 0921-5093
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