PASE-scan design: a new full-scan structure to reduce test application time

✍ Scribed by Solana, J.M.; Manzano, M.A.

• Book ID: 114448403
• Publisher: The Institution of Electrical Engineers
• Year: 1999
• Tongue: English
• Weight: 945 KB
• Volume: 146
• Category: Article
• ISSN: 1350-2387
• DOI: 10.1049/ip-cdt:19990812