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Particular artifacts of topographic images of dielectrics in atomic-force microscopy

✍ Scribed by A. L. Tolstikhina; R. V. Gaĭnutdinov; M. L. Zanaveskin; K. L. Sorokina; N. V. Belugina; Yu. V. Grishchenko

No coin nor oath required. For personal study only.

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