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Particle size distributions obtained from diffraction patterns: Contribution of refraction and reflection

โœ Scribed by G. Roy; P. Tessier


Book ID
115949097
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
532 KB
Volume
21
Category
Article
ISSN
0021-8502

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โœ Heimo Schnablegger; Otto Glatter ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 782 KB

Static light-scattering experiments can be used to determine particle sizes in the range from \(50 \mathrm{~nm}\) up to several micrometers. The relative refractive index of the particles is required in computation procedures to obtain the true size distribution. In cases where the relative refracti