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Particle size analysis techniques for metal powders and frits used in thick-film pastes: R. P. Anjard, Sr Microelectron. J. 13 (5), 16 (1982)


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
181 KB
Volume
15
Category
Article
ISSN
0026-2692

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✦ Synopsis


continued from page 6 t tent results allowing one to describe the variation of the carrier scattering mechanisms across the film and to determine the exact profiles for carrier mobilities and concentration as well as for the anisotrop coefficient.