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Particle identification by means of fine sampling dE/dX measurements

✍ Scribed by A. Imanishi; T. Ishii; T. Ohshima; H. Okuno; K. Shiino; F. Naito; T. Matsuda

Publisher: Elsevier Science
Year: 1983
Weight: 497 KB
Volume: 207
Category: Article
ISSN: 0167-5087
DOI: 10.1016/0167-5087(83)90646-4

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