✦ LIBER ✦
Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets
✍ Scribed by Das, S.R.; Sudarma, M.; Assaf, M.H.; Petriu, E.M.; Jone, W.-B.; Chakrabarty, K.; Sahinoglu, M.
- Book ID
- 114629438
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 986 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9456
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