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Paraxial speckle-based metrology systems with an aperture

✍ Scribed by Kelly, Damien P.; Ward, Jennifer E.; Hennelly, Bryan M.; Gopinathan, Unnikrishnan; O'Neill, Feidhlim T.; Sheridan, John T.

Book ID
115390715
Publisher
Optical Society of America
Year
2006
Tongue
English
Weight
516 KB
Volume
23
Category
Article
ISSN
1084-7529

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