Parasitic series resistance extraction and impact ionization current modeling for SOI MOSFETs

✍ Scribed by S. Pidin; M. Koyanagi

• Book ID: 108361571
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 721 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(97)00035-9