✦ LIBER ✦
Parasitic capacitance removal of sub-100 nm p-MOSFETs using capacitance–voltage measurements
✍ Scribed by Daniel R. Steinke; Joseph Piccirillo; Steven C. Gausepohl; Saikumar Vivekand; Martin P. Rodgers; Ji Ung Lee
- Book ID
- 113916077
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 568 KB
- Volume
- 68
- Category
- Article
- ISSN
- 0038-1101
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