✦ LIBER ✦
Parametric yield optimisation of MOS VLSI circuits based on simulated annealing and its parallel implementation
✍ Scribed by Conti, M.; Orcioni, S.; Turchetti, C.
- Book ID
- 114447392
- Publisher
- The Institution of Electrical Engineers
- Year
- 1994
- Tongue
- English
- Weight
- 956 KB
- Volume
- 141
- Category
- Article
- ISSN
- 1350-2409
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