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Parameter sensitivity analysis for computer modelling of metal-semiconductor junctions

✍ Scribed by K. Tarnay; B. Elfsten; F. Masszi; P.A. Tove

Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 362 KB
Volume: 29
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(86)90142-5

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