✦ LIBER ✦
Parameter detection of thin films from their X-ray reflectivity by support vector machines
✍ Scribed by Daniel J. Strauß; Gabriele Steidl; Udo Welzel
- Book ID
- 108057331
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 200 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0168-9274
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