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Parallel algorithms for terminal-pair reliability : Narsingh Deo and Muralidhar Medidi. IEEE Transactions on Reliability41(2), 201 (1992)

Book ID: 103283256
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 222 KB
Volume: 33
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(93)90165-u

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