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p(2×2) Phase of Buckled Dimers of Si(100) Observed on n-Type Substrates below 40 K by Scanning Tunneling Microscopy

✍ Scribed by Hata, Kenji; Yoshida, Shoji; Shigekawa, Hidemi


Book ID
111891705
Publisher
The American Physical Society
Year
2002
Tongue
English
Weight
562 KB
Volume
89
Category
Article
ISSN
0031-9007

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