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P. Krishna (ed.). Recent advances in X-ray characterization of materials — II. Progress in crystal growth and characterization vol. 18. Pergamon Press 1989, 271 pages, 136 Figures, 12 Tables, $ 225.00, ISBN 0-08-037368-2

✍ Scribed by H. R. Höche


Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
59 KB
Volume
25
Category
Article
ISSN
0232-1300

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