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Oxygen-vacancy-related dielectric relaxation in BiFeO 3 films grown by pulsed laser deposition

✍ Scribed by Li, Y W; Hu, Z G; Yue, F Y; Yang, P X; Qian, Y N; Cheng, W J; Ma, X M; Chu, J H


Book ID
121235496
Publisher
Institute of Physics
Year
2008
Tongue
English
Weight
241 KB
Volume
41
Category
Article
ISSN
0022-3727

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