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Oxygen annealing of ex-situ YBCO/Ag thin-film interfaces

✍ Scribed by Ekin, J.W.; Clickner, C.C.; Russek, S.E.; Sanders, S.C.

Book ID
121341002
Publisher
IEEE
Year
1995
Tongue
English
Weight
380 KB
Volume
5
Category
Article
ISSN
1051-8223

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We report on the effect of pressure, ageing and in situ annealing on the electrical resistivity and temperature coefficient of resistance in thin samarium films over the thickness range lOiN A. On annealing at 180Β°C for 2 h. film resistivity increases for lower thicknesses but remains constant for h