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Oxygen addition to fluorine based SiN etch process: Impact on the electrical properties of AlGaN/GaN 2DEG and transistor characteristics

✍ Scribed by H. Hahn; J. Achenbach; N. Ketteniss; A. Noculak; H. Kalisch; A. Vescan


Book ID
113916073
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
804 KB
Volume
67
Category
Article
ISSN
0038-1101

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