✦ LIBER ✦
Oxide Thickness Scaling Limit for Optimum CMOS Logic Circuit Performance
✍ Scribed by Bowman, K.A. ;Lihui Wang, ;Xinghai Tang, ;Meindl, J.D.
- Book ID
- 121819094
- Publisher
- IEEE
- Year
- 2000
- Weight
- 115 KB
- Series
- undefined series for scimag
- Category
- Article
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