XPS Studies of Oxide Growth and Segregat
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Werrett, C. R.; Pyke, D. R.; Bhattacharya, A. K.
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Article
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1997
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John Wiley and Sons
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English
โ 285 KB
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The oxidation of three aluminium-silicon alloys has been studied as a function of temperature. At temperatures below 473 K a thin passivating oxide รlm is formed. At higher temperatures the segregation of the trace element magnesium to the surface is observed where it dominates the subsequent oxidat