Oxidation-Induced Modifications of Trap Parameters in Nanocrystalline Porous Silicon

✍ Scribed by Draghici, M. ;Miu, M. ;Iancu, V. ;Nassiopoulou, A. ;Kleps, I. ;Angelescu, A. ;Ciurea, M.L.

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 75 KB
• Volume: 182
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/1521-396x(200011)182:1<239::aid-pssa239>3.0.co;2-k