✦ LIBER ✦
Oxidation effects on transport characteristics of nanoscale MOS capacitors with an embedded layer of silicon nanocrystals obtained by low energy ion implantation
✍ Scribed by J. Grisolia; M. Shalchian; G. BenAssayag; H. Coffin; C. Bonafos; S. Schamm; S.M. Atarodi; A. Claverie
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 262 KB
- Volume
- 124-125
- Category
- Article
- ISSN
- 0921-5107
No coin nor oath required. For personal study only.