✦ LIBER ✦
Overlayer thickness determination by angular dependent X-ray photoelectron spectroscopy (ADXPS) of rough surfaces with a spherical topography
✍ Scribed by P. Kappen; K. Reihs; C. Seidel; M. Voetz; H. Fuchs
- Book ID
- 117215071
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 437 KB
- Volume
- 465
- Category
- Article
- ISSN
- 0039-6028
No coin nor oath required. For personal study only.