Surface morphology of PECVD fluorocarbon
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Catherine B. Labelle; Karen K. Gleason
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Article
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1999
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John Wiley and Sons
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English
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Atomic force microscopy (AFM) measurements have been made on a series of fluorocarbon films deposited from pulsed plasmas of hexafluoropropylene oxide (HFPO), 1,1,2,2-tetrafluoroethane (C 2 H 2 F 4 ), and difluoromethane (CH 2 F 2 ). All of the films give images showing nodular growth (cauliflower-l