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Oscillatory behavior of the magnetoresistance versus Cu spacer thickness in UHV-grown Co / Cu(111) multilayers

✍ Scribed by C. Dupas; E. Kolb; K. Le Dang; J.P. Renard; P. Veillet; E. Vélu; D. Renard


Book ID
113318164
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
339 KB
Volume
128
Category
Article
ISSN
0304-8853

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