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Origins of saccharin-induced stress reduction based on observed fracture behavior of electrodeposited Ni films

✍ Scribed by Soni, Sumit K.; Sheldon, Brian W.; Hearne, Sean J.


Book ID
121591044
Publisher
Springer
Year
2013
Tongue
English
Weight
557 KB
Volume
49
Category
Article
ISSN
0022-2461

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