Origin of the Tilt of Crystalline Axis Influenced by the N-Beam Incidence Direction in rf-MBE of Cubic GaN Epilayer on (001) GaAs

✍ Scribed by H. Hayashi; A. Hayashida; A.W. Jia; M. Kobayashi; M. shimotomai; Y. Kato; A. Yoshikawa; K. Takahashi

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 155 KB
• Volume: 216
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/(sici)1521-3951(199911)216:1<241::aid-pssb241>3.0.co;2-7