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Origin of Luminescence from Silicon Nanocrystals: a Near Edge X-ray Absorption Fine Structure (NEXAFS) and X-ray Excited Optical Luminescence (XEOL) Study of Oxide-Embedded and Free-Standing Systems
✍ Scribed by Hessel, Colin M.; Henderson, Eric J.; Kelly, Joel A.; Cavell, Ronald G.; Sham, Tsun-Kong; Veinot, Jonathan G. C.
- Book ID
- 126325770
- Publisher
- American Chemical Society
- Year
- 2008
- Tongue
- English
- Weight
- 640 KB
- Volume
- 112
- Category
- Article
- ISSN
- 1932-7447
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