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Origin of luminescence from porous silicon deduced by synchrotron-light-induced optical luminescence

✍ Scribed by Sham, T. K.; Jiang, D. T.; Coulthard, I.; Lorimer, J. W.; Feng, X. H.; Tan, K. H.; Frigo, S. P.; Rosenberg, R. A.; Houghton, D. C.; Bryskiewicz, B.

Book ID
109784288
Publisher
Nature Publishing Group
Year
1993
Tongue
English
Weight
552 KB
Volume
363
Category
Article
ISSN
0028-0836

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## Abstract The recent advances in the study of light emission from matter induced by synchrotron radiation: X‐ray excited optical luminescence (XEOL) in the energy domain and time‐resolved X‐ray excited optical luminescence (TRXEOL) are described. The development of these element (absorption edge)