## Abstract The texture development of PEN films with different semicrystalline morphologies have been studied by Xβray diffraction. These different structures have been obtained by uniaxially stretching PEN amorphous films at 100 and 160Β°C (below and above __T__~__g__~) at different drawing ratios
β¦ LIBER β¦
Orientation of uniaxially stretched poly(ethylene naphthalene 2,6-dicarboxylate) films by polarized infrared spectroscopy
β Scribed by C. Hakme; I. Stevenson; A. Voice; G. Lespinasse; G. Seytre; L. David
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 279 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0887-6266
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## Abstract An optical nondestructive strain measurement technique was performed to analyze the mechanical deformation induced by an electrical field within the insulating materials. Poly(ethylene naphthalene 2,6βdicarboxylate) (PEN) films were then subjected to constant electrical fields right up
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