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Orientation effect on microwave dielectric properties of Si-integrated Ba[sub 0.6]Sr[sub 0.4]TiO[sub 3] thin films for frequency agile devices

✍ Scribed by Kim, Hyun-Suk; Hyun, Tae-Seon; Kim, Ho-Gi; Kim, Il-Doo; Yun, Tae-Soon; Lee, Jong-Chul

Book ID: 120486015
Publisher: American Institute of Physics
Year: 2006
Tongue: English
Weight: 967 KB
Volume: 89
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2236099

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